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HK: Fachverband Physik der Hadronen und Kerne
HK 21: Instrumentation 7
HK 21.3: Vortrag
Dienstag, 24. März 2015, 15:15–15:30, M/HS1
Characterization of silicon micro-strip sensors with a pulsed infra-red laser system for the CBM experiment at FAIR — •Pradeep Ghosh1,2 and Jürgen Eschke2,3 for the CBM collaboration — 1Goethe University, Frankfurt am Main — 2GSI Helmholtz Center for Heavy Ion Research GmbH, Darmstadt — 3Facility for Anti-proton and Ion Research, GmbH, Darmstadt
The Silicon Tracking System (STS) of the CBM experiment at FAIR is composed of 8 tracking stations comprising of 1292 double-sided silicon micro-strip sensors. A Laser Test System (LTS) has been developed for the quality assurance of prototype sensors. The aim is to scan sensors with a pulsed infra-red laser driven by step motor to determine the charge sharing in-between strips and to measure qualitative uniformity of the sensor response over the whole active area. Several prototype sensors with strip pitch of 50 and 58 µm have been tested, as well as a prototype module with realistic mechanical arrangement of sensor and read-out cables. The LTS is designed to measure sensor response in an automatized procedure across the sensor with focused laser beam (spot-size ≈ 12 µm , wavelength = 1060 nm). The pulse with duration (≈ 10 ns) and power (≈ 5 mW) of the laser pulses is selected such, that the absorption of the laser light in the 300 µm thick silicon sensors produces a number of about 24000 electrons, which is similar to the charge created by minimum ionizing particles (MIP) in these sensors. Results from laser scans of prototype sensors and detector module will be reported.
The work is supported by HGS-HIRe, H-QM and HIC-for-FAIR.