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Q: Fachverband Quantenoptik und Photonik

Q 62: Poster: Quantum Optics and Photonics III

Q 62.87: Poster

Donnerstag, 26. März 2015, 17:00–19:00, C/Foyer

Relative Intensity Correction of Raman Spectrometers with NIST Standard Reference Material 2242 in 90° scattering geometry — •Magnus Schlösser, Simone Rupp, Tim Brunst, and Timothy M. James — Tritium Laboratory Karlsruhe, Institute of Technical Physics, Karlsruhe Institute of Technology

The US National Institute of Standards and Technology (NIST) has certified a set of Standard Reference Materials (SRM) which can be used to accurately determine the spectral sensitivity of Raman spectrometers. These solid state reference sources offer benefits like exact reproduction of Raman sampling geometry, simple implementation, or long-term stability. A serious drawback of these SRMs is that they are only certified in the back scattering (180°) configuration. In our work, we investigated if and how an SRM 2242 (applicable for 532 nm) can be employed in a 90° scattering geometry Raman system. We found and tested that the measurement procedure needs to be modified in order to comply with the certified uncertainty by NIST. This requires certain changes of the SRM illumination like considering the roughness of the laser entrance side surfaces, the appropriate polarization of the excitation beam andthe inner-filter effect. Finally, we present a round robin test performed to evaluate the systematic uncertainty of our procedure.