Wuppertal 2015 – scientific programme
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T: Fachverband Teilchenphysik
T 35: Halbleiter: F&E 2
T 35.4: Talk
Monday, March 9, 2015, 17:35–17:50, K.12.16 (K4)
Development of a Versatile Readout and Test System and Characterization of a Capacitively Coupled Active Pixel Sensor — •Jens Janssen1, Laura Gonella1, Tomasz Hemperek1, Toko Hirono1, Fabian Hügging1, Hans Krüger1, Ivan Perić2, and Norbert Wermes1 for the ATLAS collaboration — 1Institute of Physics, University of Bonn, Bonn, Germany — 2Karlsruher Institut für Technologie, Karlsruhe, Germany
With the availability of high voltage and high resistivity CMOS processes, active pixel sensors are becoming increasingly interesting for radiation detection in high energy physics experiments. Although the pixel signal-to-noise ratio and the sensor radiation tolerance were improved, active pixel sensors cannot yet compete with state-of-the-art hybrid pixel detector in a high radiation environment. Hence, active pixel sensors are possible candidates for the outer tracking detector in HEP experiments where production cost plays a role. The investigation of numerous prototyping steps and different technologies is still ongoing and requires a versatile test and readout system, which will be presented in this talk. A capacitively coupled active pixel sensor fabricated in AMS 180 nm high voltage CMOS process is investigated. The sensor is designed to be glued to existing front-end pixel readout chips. Results from the characterization are presented in this talk.