Wuppertal 2015 – wissenschaftliches Programm

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T: Fachverband Teilchenphysik

T 44: Halbleiter: F&E 3

T 44.6: Vortrag

Dienstag, 10. März 2015, 18:00–18:15, G.10.03 (HS 8)

Tests of the Gated Mode for Belle II Pixel Detector — •Eduard Prinker for the Belle II collaboration — Max-Planck-Institute for Physics, Munich, Germany

DEPFET pixel detectors offer intrinsic amplification and very high signal to noise ratio. They form an integral building block for the vertex detector system of the Belle II experiment, which will start data taking in the year 2017 at the SuperKEKB Collider in Japan. A special Test board (Hybrid4) is used, which contains a small version of the DEPFET sensor with a read-out (DCD) and a steering chip (Switcher) attached, both controlled by a field-programmable gate array (FPGA) as the central interface to the computer. In order to keep the luminosity of the collider constant over time, the particle bunch currents have to be topped off by injecting additional bunches at a rate of 50 Hz. The particles in the daughter bunches produce a high rate of background (noisy bunches) for a short period of time, saturating the occupancy of the sensor. Operating the DEPFET sensor in a Gated Mode allows preserving the signals from collisions of normal bunches while protecting the pixels from background signals of the passing noisy bunches.

An overview of the Gated Mode and first results will be presented.