Wuppertal 2015 – wissenschaftliches Programm
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T: Fachverband Teilchenphysik
T 63: Halbleiter: Strahlenhärte
T 63.8: Vortrag
Mittwoch, 11. März 2015, 18:30–18:45, G.10.05 (HS 7)
Investigation of the electric field in irradiated diamond sensors — •Florian Kassel1, Tobias Barvich1, Wim de Boer1, Anne Dabrowski2, Alexander Dierlamm1, Robert Eber1, Moritz Guthoff2, Andreas Nürnberg1, and Pia Steck1 — 1Institut für Experimentelle Kernphysik (IEKP), Karlsruher Institut für Technologie (KIT) — 2CERN
The Beam Condition Monitoring Leakage (BCML) system is a beam monitoring device in the CMS experiment at the LHC. As detectors 32 poly-crystalline CVD diamond sensors are positioned in a ring around the beam pipe at a distance of +/-1.8 m and +/-14.4 m from the interaction point. The radiation hardness of the diamond sensors in terms of measured signal during operation was significantly lower than expected based on laboratory measurements.
At high particle rates, like they occur during the operation of the LHC, charge carriers can be trapped in defects created by radiation. This space charge is expected to modify the electrical field in the sensor bulk and hence to reduce the charge collection efficiency. This modified electrical field has been indirectly measured in the laboratory using the Transient Current Technique (TCT) method in irradiated single crystal CVD diamond.
This rate dependent effect was simulated with the software 'SILVACO ATLAS' and the obtained electrical field was used to calculate a TCT measurement pulse. The results of the TCT measurements will be compared to the simulation.