Hamburg 2016 – wissenschaftliches Programm
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T: Fachverband Teilchenphysik
T 33: Detektorsysteme I
T 33.6: Vortrag
Montag, 29. Februar 2016, 18:05–18:20, VMP8 SR 205
Electric field deformation in diamond sensors induced by radiation defects — •Florian Kassel1, Wim de Boer1, Felix Bögelspacher1, Anne Dabrowski2, Alexander Dierlamm1, Moritz Guthoff2, Thomas Müller1, and Pia Steck1 — 1Institut für Experimentelle Kernphysik (IEKP), Karlsruher Institut für Technologie (KIT) — 2CERN
The BCML system is a beam monitoring device in the CMS experiment at the LHC. As detectors 32 poly-crystalline CVD diamond sensors are positioned in a ring around the beam pipe at a distance of +-1.8 m and +-14.4 m from the interaction point. The radiation hardness of the diamond sensors in terms of measured signal during operation was significantly lower than expected from laboratory measurements. At high particle rates, such as those occurring during the operation of the LHC, a significant fraction of the defects act as traps for charge carriers. This space charge modifies the electrical field in the sensor bulk leading to a reduction of the charge collection efficiency (CCE).
A diamond irradiation campaign was started to investigate the rate dependent electrical field deformation with respect to the radiation damage. Besides the electrical field measurements via the Transient Current Technique, the CCE was measured. The experimental results were used to create an effective trap model that takes the radiation damage into account. Using this trap model the rate dependent electrical field deformation and the CCE were simulated with the software "SILVACO TCAD". This talk will compare the experimental measurement results with the simulations.