Hamburg 2016 – scientific programme
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T: Fachverband Teilchenphysik
T 96: Halbleiterdetektoren V (DEPFET)
T 96.7: Talk
Thursday, March 3, 2016, 18:15–18:30, VMP8 HS
Optimization of ADC Transfer Curves for the Belle II Pixel Detector — •Jakob Haidl1, Felix Müller1, Christian Koffmane2, Hans-Günther Moser1, Christian Kiesling1, and Manfred Valentan1 for the Belle II collaboration — 1Max-Planck-Institut für Physik, München — 2Halbleiterlabor der Max-Planck-Gesellschaft, München
The Super-KEKB accelerator at the KEK high energy research center in Tsukuba in Japan will provide a 40 times higher luminosity. To cope with this high luminosity the Belle detector is improved to Belle II, which includes the integration of a two layer DEPFET pixel detector (PXD) resulting in a higher vertex resolution. The task of the read-out electronics is to process the high data rate of the PXD. To fulfill these requirements three different types of ASICs were designed. The foremost of them called Drain Current Digitizer (DCD) converts the drain currents of the DEPFET pixel sensors into digital code. Since the PXD will be equipped with 160 DCDs automatic testing of the chips is needed. Analog to digital transfer curves are an appropriate tool for error recognition and optimization of the digitization process within the DCD. An overview of measurements and optimization strategies will be presented.