Hannover 2016 – wissenschaftliches Programm
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A: Fachverband Atomphysik
A 18: Highly charged ions and their applications
A 18.4: Poster
Dienstag, 1. März 2016, 16:30–19:00, Empore Lichthof
Resonant excitation of highly charged ions at ultrabrilliant light sources — •Sven Bernitt1,2, René Steinbrügge1, Stepan Dobrodey1, Jan K. Rudolph1,3, Sascha W. Epp4, and José R. Crespo López-Urrutia1 — 1Max-Planck-Institut für Kernphysik, Heidelberg, Germany — 2IOQ, Friedrich-Schiller-Universität, Jena, Germany — 3IAMP, Justus-Liebig-Universität. Gießen, Germany — 4Max-Planck-Institut für Struktur und Dynamik der Materie, Hamburg, Germany
The transportable electron beam ion trap FLASH-EBIT was used to provide targets of trapped highly charged ions for VUV and X-ray radiation from the free-electron lasers FLASH and LCLS, as well as the synchrotron light sources BESSY II and PETRA III. By observing resonantly excited fluorescence we were able to measure transition energies and natural line widths. By simultaneously detecting changes of ion charge states we were able to deduce branching ratios and absolute radiative and Auger decay rates.
Our measurements provide valuable data for the interpretation of spectra from astrophysical and laboratory plasmas, and by studying high-Z few-electron systems, we can provide tests of atomic theory on the level of QED contributions.