Hannover 2016 – scientific programme

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A: Fachverband Atomphysik

A 22: Interaction with VUV and X-ray light

A 22.15: Poster

Tuesday, March 1, 2016, 16:30–19:00, Empore Lichthof

High-intensity narrow-band x-ray lasing with highly charged ions — •Chunhai Lyu, Zoltán Harman, Stefano M. Cavaletto, and Christoph H. Keitel — Max-Planck-Institut für Kernphysik, Saupfercheckweg 1, 69117 Heidelberg, Germany

Intense ultrashort x-ray free electron laser (XFEL) pulses can create population inversion through K-shell ionization of highly charged ions. This allows the generation of an x-ray laser pulse with better coherence properties than the original XFEL pulse. Our time-depenent density matrix simulations show that the bandwidth of the x-ray laser can be reduced if one uses certain highly charged ions. The saturation intensity of the x-ray laser is no longer limited by the lifetime of the upper lasing level, and can be increased significantly by implementing more intense XFEL pulses. Furthermore, the frequency of the laser can be extended to the hard x-ray regime when heavy ions are employed.