Regensburg 2016 – scientific programme
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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 49: Organic Electronics and Photovoltaics II (joint session CPP/DS/HL/O, organized by CPP)
CPP 49.11: Talk
Thursday, March 10, 2016, 12:30–12:45, H40
Resonant GISAXS on ternary thin film systems — •Mihael Coric1, Nitin Saxena2, Jan Wernecke3, Stefanie Langner3, Peter Müller-Buschbaum2, Michael Krumrey3, and Eva M. Herzig1 — 1Technische Universität München, Munich School of Engineering, 85748 Garching, Germany — 2TU München, Physik-Department, LS Funktionelle Materialien, 85748 Garching, Germany — 3Physikalisch-Technische Bundesanstalt (PTB), Abbestraße 2-12, 10587 Berlin, Germany
Using additives to influence the properties of a material is an extensively used method in material science. It is also an approach to achieve morphological control in binary thin film systems like in organic photovoltaic systems. If the third component is also a polymer the morphological characterization poses a challenge since the sophisticated thin film characterization methods like grazing incidence small angle x-ray scattering (GISAXS) carried out a high x-ray energies can only distinguish between different electron densities. Using x-ray energies near the absorption edges of certain elements contained in the polymers enables a much higher contrast between the different materials, increasing the distinguishability of the different components within the active film of the organic solar cell. However, it is also challenging to interpret the scattering data correctly since some approximations routinely carried out in the theory used for interpretation of hard x-rays are no longer valid. We show our systematic measurements at the sulphur and chlorine edge and explain the advantages we can take out of the measurements to analyze the morphology of this ternary thin film.