Regensburg 2016 – scientific programme
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DF: Fachverband Dielektrische Festkörper
DF 11: Poster
DF 11.29: Poster
Wednesday, March 9, 2016, 18:00–20:00, Poster E
Optical and electrooptical properties of PZT studied by Muller matrix ellipsometry — •Jakub Havlicek1, Vladimir Foldyna1, Jaroslav Hamrle1, Jaromir Pištora1, Yoichiro Hashizume2, and Soichiro Okamura2 — 1VSB-Technical University of Ostrava, 17. listopadu 15, Ostrava, Czech Republic — 2Tokyo University of Science, 6-3-1 Niijuku Katsushika-ku, 125-8585 Tokyo, Japan
The optical and electrooptical properties of Pb[Zr0,44Ti0,56]O3 (PZT) thin film have been investigated using Muller matrix ellipsometry. The studied structure consists of Au(10 and 20 nm)/PZT(1000 nm)/Pt(100 nm)/Si, where contacted top Au electrode of diameter 3 mm allows to apply voltage (up to 60V per 1 ms, i.e. up to 0.6 MV/cm) in order to electrically polarize PZT crystal.
The investigations were done using Mueller matrix ellipsometry [1,2], working in spectral range 0.8 - 6.2 eV. From those measurements, we determine both optic spectra of PZT (contribution to permittivity independent on PZT polarization) and spectra of Pockels effect (contribution to permittivity linear with polarization).
[1] H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications (Willey) (2007). [2] D.H. Goldstein, Mueller matrix dual-rotating retarder polarimeter, Applied Optics, 31, 6676-6683 (1992).