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DF: Fachverband Dielektrische Festkörper

DF 11: Poster

DF 11.32: Poster

Mittwoch, 9. März 2016, 18:00–20:00, Poster E

Analysis of the frequency spectra in PFM — •Sarmed Hussain and Elisabeth Soergel — Physikalisches Institut, Bonn, Germany

Piezoresponse force microscopy (PFM) has emerges as a key-method for mapping domain patterns in ferroelectric materials with high lateral resolution an impressive sensitivity. For recording quantitatively reliable data (in terms of the magnitude of the piezomechanical response), however, a method for calibration is still missing. Besides the need for a calibration standard, there is in addition the difficulty of the frequency dependence of the data recorded, most prominent when investigating samples with small piezoelectric coefficients. Although it might eventually not be possible to get rid of this frequency dependence, its origin is of interest for a better evaluation of the, presumably quantitative PFM-data obtained.