Regensburg 2016 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 12: Postersession DS

DS 12.10: Poster

Montag, 7. März 2016, 17:00–19:00, Poster A

A critical look at the resolution function of a TOF neutron reflectometer and why we should care when we do GISANS experiments — •Jean-François Moulin and Sebastian Busch — German Engineering Materials Science Centre (GEMS) at Heinz Maier-Leibnitz Zentrum (MLZ), Helmholtz-Zentrum Geesthacht GmbH, Lichtenbergstr. 1, 85747 Garching bei München, Germany

Grazing incidence small angle neutron scattering (GISANS) is increasingly used to characterize the structure of thin films. This method makes it possible to detect lateral correlations over a broad range of length scales (from nm to µm). Because the probing wave is evanescent one can tune the depth from which the scattering originates. This makes it in theory possible to perform structural depth profiling, but unfortunately the penetration depth is a very steep function of the wavelength (or incident angle) which means that high resolution measurements are needed or at the very least that a good knowledge of the resolution function is fundamental. We will show a detailed analysis of the resolution function of a time-of-flight neutron reflectometer and illustrate how the data binning scheme as well as the primary wavelength spectrum shape can affect the accuracy of penetration depth measurements. The influence of these resolution effects in the case of conventional reflectivity measurements will also be discussed.