Regensburg 2016 – scientific programme
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DS: Fachverband Dünne Schichten
DS 12: Postersession DS
DS 12.5: Poster
Monday, March 7, 2016, 17:00–19:00, Poster A
RBS-Investigations of Mo-doped BiVO4 thin films deposited by reactive magnetron sputtering — •Marie Mende1, Emanuel Schmidt1, Fuxian Wang2, Klaus Ellmer2, and Elke Wendler1 — 1Institut für Festkörperphysik, Friedrich-Schiller-Universität Jena, Helmholtzweg 3, 07743 Jena, Germany — 2Helmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, 14109 Berlin, Germany
Bismuth vanadate (BiVO4) has recently emerged as a promising material for the use as photoanode in solar water splitting applications. However, the performance of BiVO4 as photoanode material is strongly limited by its intrinsically slow electron and hole transport.
In order to overcome these limitations, novel doping strategies have been developed. To benefit from these modification and fabrication methods an extensive control of the composition and the dopant concentration must be guaranteed.
In this work we investigate molybdenum doped thin film samples of BiVO4 deposited on glassy carbon or (100) yttria-stabilized zirconia (YSZ) substrates with different dopant contents by reactive magnetron sputtering from a Bi and a V target. Rutherford-Backscattering-Spectroscopy (RBS) is used to determine the structure (epitaxial growth) and composition of these layers for assisting further investigations regarding the dependence of photocatalytic activity on the material composition and doping.