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09:30 |
DS 16.1 |
The contribution has been withdrawn.
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09:45 |
DS 16.2 |
Ultrafast dynamics of coherent acoustic phonons in thin gold films investigated by surface plasmon resonance — •Felix Noll, Nico Krauß, and Thomas Dekorsy
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10:00 |
DS 16.3 |
The Effect of Layer Thickness on the Magnetic and Magneto-optical Properties of Sputtered and Annealed La1−xSrxMnO3 Thin Films on Silicon — •Manuel Monecke, Oana-Tereza Ciubotariu, Peter Richter, Patrick Thoma, Georgeta Salvan, and Dietrich R.T. Zahn
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10:15 |
DS 16.4 |
Resonance X-ray reflectivity — a tool to extract chemical and valence profiles and its application to SmB6. — •Volodymyr Zabolotnyy, Katrin Fürsich, Robert Green, Abdul Tcakaev, Ronny Sutarto, Feizhou He, Maurits Haverkort, Dmytro Inosov, and Vladimir Hinkov
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10:30 |
DS 16.5 |
Surface anchored metal organic framework for direct light emission. — •Nicolò Baroni, Ian Howard, Andrey Trushtov, Redel Engelbert, Christof Wöll, and Bryce Sydney Richards
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10:45 |
DS 16.6 |
Plasmonic Gold nanocross array for efficient solar to chemical energy conversion — •Wenxin Wang, Yan Zheng, and Yong Lei
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11:00 |
DS 16.7 |
Study of the properties of sputtered ZnO:Al layers on ultra-thin glass — •Jasper Westphalen, Manuela Junghähnel, and Edda Rädlein
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11:15 |
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15 min. break.
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11:30 |
DS 16.8 |
Epitaxial growth of Fe on Ag(001) and magnetoelastic coupling in Fe — •Kenia Novakoski Fischer and Dirk Sander
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11:45 |
DS 16.9 |
Material parameter determination for ScAlN sputtered layers — •Nicolas Kurz, Mohammadfazel Parsapourkolour, Paul Muralt, Yuan Lu, Agne Zukauskaite, Ulrike Roesler, Pascal Nicolay, Vadim Lebedev, and Oliver Ambacher
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12:00 |
DS 16.10 |
Reactive magnetron sputtering of stress-controlled piezoelectric AlScN thin films — •Yuan Lu, Markus Reusch, Tim Christoph, Vadim Lebedev, Nicolas Kurz, Lutz Kirste, Oliver Ambacher, and Agne Zukauskaite
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12:15 |
DS 16.11 |
Vibrational modes of ultrathin carbon nanomembrane mechanical resonators — •Xianghui Zhang, Reimar Waitz, Fan Yang, Carolin Lutz, Polina Angelova, Armin Gölzhäuser, and Elke Scheer
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12:30 |
DS 16.12 |
High-temperature micro-mechanical testing of a thin-film CrN tooling system — •James P Best, Johannes Zechner, Jeffrey M Wheeler, Juri Wehrs, Marcus Morstein, and Johann Michler
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12:45 |
DS 16.13 |
Structural and optical properties of TiO2-films with thicknesses from 2 to 200 nm deposited with RF-diode sputtering — Jingyi Shi, •Sebastian Schippreit, Klaus Pärschke, and Dieter Mergel
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