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15:00 |
DS 35.1 |
Transrotational microcrystals: novel solid state order formed in amorphous films — •Vladimir Yu. Kolosov
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15:15 |
DS 35.2 |
Electronic properties of LaPO4 nanoparticles studied by thehard X-Ray photoelectron spectroscopy. — •A. Gloskovskii, Ya. Chornodolskyy, V. Vistovskyy, O. Shevchuk, O. Myagkota, S. Syrotyuk, A. Zaichenko, A. Voloshinovskii, and W. Drube
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15:30 |
DS 35.3 |
Determination of thickness and refractive index of ulta-thin films via ellipsometry — Peter Nestler and •Christiane A. Helm
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15:45 |
DS 35.4 |
Depth-resolved image of the LaAlO3/SrTiO3 system from Resonant Soft X-ray Reflectivity — •Martin Zwiebler, Fabio Miletto Granozio, Emiliano Di Gennaro, Jorge Enrique Hamann-Borrero, Enrico Schierle, Eugen Weschke, Jochen Geck, Marco Salluzzo, and Umberto Scotti di Uccio
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16:00 |
DS 35.5 |
Analysis of interface properties of multilayer mirrors with sub-nanometer layer thicknesses — •Anton Haase, Saša Bajt, Victor Soltwisch, Philipp Hönicke, Christian Laubis, and Frank Scholze
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16:15 |
DS 35.6 |
Sample thickness in Transmission Kikuchi Diffraction via Monte Carlo Simulations — •Nathanael Jöhrmann and Michael Hietschold
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16:30 |
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15 min. break.
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16:45 |
DS 35.7 |
Chemical Characterization of electrodeposited transition metal chalcogenite layers — Talha Nisar, •Torsten Balster, and Veit Wagner
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17:00 |
DS 35.8 |
Surface chemistry of free-base corrole on Ag(111): Complementary insights from X-ray spectroscopy, DFT and STM. — •Mateusz Paszkiewicz, Stefano Tebi, Hazem Aldahhak, Wolfgang Schöfberger, Stefan Müllegger, Uwe Gerstmann, Eva Rauls, Wolf Gero Schmidt, Reinhold Koch, David Duncan, Francesco Allegretti, Johannes Barth, and Florian Klappenberger
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17:15 |
DS 35.9 |
Dependence of Optoelectronic Properties on Composition in CuInSe2 — •Sergiu Levcenco, Helena Stange, Roland Mainz, and Thomas Unold
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17:30 |
DS 35.10 |
Nanostructured surface of multilayer graphene on 3C-SiC (001) — •Victor Aristov, Olga Molodtsova, Sergey Babenkov, Dmitry Marchenko, Jaime Sánchez-Barriga, Partha Sarathi Mandal, Andrei Varykhalov, Alexei Zakharov, Yuran Niu, Alexei Preobrajenski, Denis Vyalikh, Marc Portail, Marcin Zielinski, Barry Murphy, Sergey Krasnikov, Olaf Luebben, Igor Shvets, and Alexander Chaika
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17:45 |
DS 35.11 |
Study of amorphous chalcogenide alloys by optical and electrical investigation — •Ju-Young Cho and Matthias Wuttig
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18:00 |
DS 35.12 |
Quantitative AM-FM Mode for Fast, Versatile Imaging of Nanoscale Elastic Modulus — Marta Kocun, Aleksander Labuda, Waiman Meinhold, •Florian Johann, and Roger Proksch
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