Regensburg 2016 – scientific programme
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DS: Fachverband Dünne Schichten
DS 53: Postersession DS/HL
DS 53.20: Poster
Thursday, March 10, 2016, 16:00–19:00, Poster A
Polarization-dependent Differential Reflectance Spectroscopy for real-time monitoring of organic thin film growth — •Andrea Navarro-Quezada, Markus Aiglinger, Ebrahim Ghanbari, Thorsten Wagner, and Peter Zeppenfeld — Institute of Experimental Physics, Johannes Kepler University, Altenbergerstr. 69, 4040 Linz, Austria
Optical spectroscopy is a powerful tool to study physical processes occurring in molecular thin films and at their interfaces with inorganic materials. In particular, differential reflectance spectroscopy (DRS) records the change in the reflectance of a surface upon physical or chemical modification. Therefore, it allows real-time monitoring of the deposition of organic thin films. In this work, we present an extended DRS setup that allows the simultaneous detection of both linear polarization states (s and p) of the reflected light [1]. The setup exhibits a signal to noise ratio better than 1000:1 as well as high signal stability, thus we detect changes in the reflectance in the order of 10−3. As a proof of principle, we have implemented polarization-dependent DRS to monitor the growth of perfluoropentacene thin films on a Ag(110) single crystal in combination with photoelectron emission spectroscopy. From the analysis of the different DRS transients for s and p polarized light, we follow the alignment of the molecules on the Ag(110) surface during growth.
[1] A. Navarro-Quezada, M. Aiglinger, E. Ghanbari, Th. Wagner, and P. Zeppenfeld, Rev. Sci. Inst. 86, 113108 (2015)