Regensburg 2016 – wissenschaftliches Programm

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DY: Fachverband Dynamik und Statistische Physik

DY 40: Crystallization, Nucleation, Self Assembly II (joint session CPP/DY, organized by CPP)

DY 40.2: Vortrag

Mittwoch, 9. März 2016, 16:30–16:45, H42

Time-resolved characterization of aggregation during printing of thin films — Stephan Pröller¹, Feng Liu², Cheng Wang³, Thomas P. Russell², Alexander Hexemer³, Peter Müller-Buschbaum⁴, and •Eva M. Herzig¹ — ¹Technische Universität München, Munich School of Engineering, Lichtenbergstr. 4, 85748 Garching , Germany — ²Department of Polymer Science and Engineering, University of Massachusetts Amherst, MA 01003 , USA — ³Lawrence Berkeley National Laboratory, Advanced Light Source Berkeley , CA 94720 , USA — ⁴TU München, Physik-Department, LS Funktionelle Materialien, James-Franck-Str. 1, 85748 Garching , Germany

The nanomorphology can strongly influence the physical properties of thin films. For example, polymer:fullerene mixtures used in the application for organic photovoltaics vary significantly in performance depending on the inner film morphology. Tracking the actual crystallization and aggregation processes on length scales ranging from sub-nanometers to several tens of nanometers reveals how the different growth processes compete with each other leading to the final film morphology.[1] We can track solvent removal, fullerene aggregation and polymer crystallization with time for different exerimental conditions using grazing incidence x-ray scattering revealing fundamental mechanisms of thin film formation. This information correlated with device performance helps to derive design principles for large scale, industrial thin film fabrication.

[1] Pröller et al, Adv. Energy Mater. DOI:10.1002/aenm.201501580