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HL: Fachverband Halbleiterphysik

HL 36: Poster Ib

HL 36.12: Poster

Tuesday, March 8, 2016, 15:00–19:00, Poster A

Determination of trap distributions in organic semiconductors by fractional TSC measurements — •Michael Bretschneider, Alexander Wagenpfahl, and Carsten Deibel — Institut für Physik, Technische Universität Chemnitz, 09126 Chemnitz, Germany

The interplay between traps and charge transport is very important for virtually all organic electronic applications, as the charge carrier mobility has a direct impact on the performance. While hole traps are thoroughly investigated, only indirect information has been available on electron traps until recently. Therefore, we aim at correlating the energetic position and concentration of electron traps in soluble organic semiconductors with their charge transport properties. The properties of these electron trap states will be determined by defect spectroscopy. In particular, we performed thermally stimulated current (TSC) measurements on polymer diodes based on P3HT and PTB7. The resulting density of trap states distribution is compared to the results of time of flight measurements to gain deeper insight in the role of traps on charge transport.