Regensburg 2016 – wissenschaftliches Programm

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MA: Fachverband Magnetismus

MA 11: Magnetic Thin Films I

MA 11.2: Vortrag

Montag, 7. März 2016, 15:15–15:30, H33

Physical and electronic characterization of nanostructured MnSi — •Nico Steinki¹, David Schroeter¹, Patryk Krzysteczko², Alexander Fernándes Scarioni², Hans Werner Schumacher², Stefan Süllow¹, and Dirk Menzel¹ — ¹Institut für Physik der Kondensierten Materie, TU Braunschweig, Germany — ²Physikalisch Technische Bundesanstalt, Braunschweig, Germany

The non-centrosymmetric B20 chiral magnet MnSi shows intriguing properties involving the existence of skyrmions. Recently, we have started production and physical characterization of MnSi thin film samples [1,2] revealing considerable changes in the magnetic phase diagram compared to bulk material [3]. To further characterize the skyrmionic phase in MnSi under geometrical constraints, we have proceeded by nanostructuring the MnSi thin films by electron beam lithography. In particular, Hall bar structures with different widths down to 100 nm have been produced. On these, we have measured the Hall effect and magnetoresistance between 1.5 and 80 K in a magnetic field up to 8 T, thus covering the temperature and field regime of the skyrmionic phase. Here, we will present first results regarding the characterization of the structures and the comparison in terms of the electronic transport properties between thin films and our nanostructures.

[1] J. Engelke et al., J. Phys. Soc. Jpn. 81, 124709 (2012)

[2] J. Engelke et al., Phys. Rev. B 89, 144413 (2014)

[3] D. Menzel et al., J. Kor. Phys. Soc. 62, 1580 (2013)