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MA: Fachverband Magnetismus
MA 17: Poster Session I
MA 17.69: Poster
Dienstag, 8. März 2016, 09:30–12:30, Poster B1
Quantitative analysis of the influence of keV Helium ion bombardment on the angular dependence of exchange bias — •Nicolas David Müglich1, Markus Meyl1, Alexander Gaul1, Gerhard Götz2, Günter Reiss2, Timo Kuschel2, and Arno Ehresmann1 — 1Institute of Physics and Center for Interdisciplinary Nanostructure Science and Technology (CINSaT), University of Kassel, Heinrich-Plett-Str. 40, Kassel D-34132, Germany — 2Physics Department, Center for Spinelectronic Materials and Devices, Bielefeld University, Universitätsstraße 25, 33501 Bielefeld, Germany
Ion bombardment induced magnetic patterning (IBMP)[1] is a powerful tool for designing artificial magnetic field landscapes. During this process a number of material properties are modified due to the energy transferred by the ions into the magnetic layer system. Although IBMP is an established method; a quantitative description of these modifications is still missing.
In the present study, angular resolved hysteresis measurements in dependence of the Helium ion dose using vectorial Kerr magnetometry were performed. By comparing these results with calculations based on a Stoner-Wohlfarth-like model, a quantitative analysis of the modifications of the magnetic properties is given. Additionally the influence of magnetic patterning on the angular resolved dependence of the exchange bias is shown.
[1] A. Ehresmann, I. Krug, A. Kronenberger, A. Ehlers and D. Engel: Journal of Magnetism and Magnetic Materials 280 (2004) 369-376