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Regensburg 2016 – wissenschaftliches Programm

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MA: Fachverband Magnetismus

MA 46: Magnetic Measurement Methods

MA 46.11: Vortrag

Donnerstag, 10. März 2016, 18:15–18:30, H33

Identical wavelength-dependent magnetooptical response of ultrathin permalloy films in multilayer structures on different substratesRajkumar Patra1, Danilo Bürger1, Roland Mattheis2, Hartmut Stöcker3, Fangbin Han4, Bin Peng4, Wenxu Zhang4, Manuel Monecke5, Georgeta Salvan5, Stefan Pofahl6, Rudolf Schäfer6, Oliver G. Schmidt1,7, and •Heidemarie Schmidt11Fakultät ETIT, TU Chemnitz — 2IPHT Jena — 3TU BA Freiberg — 4UESTC, China — 5Fakultät Physik, TU Chemnitz — 6Metallic Materials, IFW Dresden — 7Integrative Nanosciences, IFW Dresden

The multilayer systems discussed in this work consist of Ru/permalloy (Py)/Ta stacks on different substrates, namely SiO2/Si and ZnO. The wavelength-dependent on-diagonal elements of the dielectric tensors of all layers in the multilayer systems have been determined from standard ellipsometry measurements and modelling. Below Curie temperature, the wavelength-dependent off-diagonal elements of the dielectric tensor of the Py films are non-zero and odd functions of magnetization. Therefore, we applied vector magnetooptical generalized ellipsometry with a 0.4 T octupole magnet [1] to study the optical anisotropy of the multilayer structures and employed the 4x4 matrix algorithm to characterize the directly measured 4x4 Mueller matrix and to extract the thickness-independent dielectric tensor [2] of the Py thin films. [1] K. Mok, N. Du, H. Schmidt, Rev. Sci. Instr. 82 (2011) 033112; [2] K. Mok, H. Schmidt et al. J. Appl. Phys. 110 (2011) 123110; Phys. Rev. B 84 (2011) 094413

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