Regensburg 2016 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

MI: Fachverband Mikrosonden

MI 1: Electron Probe Microanalysis

MI 1.2: Vortrag

Dienstag, 8. März 2016, 10:15–10:30, H5

EDS; Analysis of Nanoparticles — •Meiken Falke — Bruker Nano GmbH, Berlin, Germany

Fast chemical analysis from the mm to the atomic scale can be carried out using energy dispersive X-ray spectroscopy (EDS) in the electron microscope. A wide analysis region is the condition for chemically characterizing not only nanoparticles but also their surroundings and distribution. Examples of analysis approaches for different types of nanoparticles, including core-shell and bio-generated nanoparticles will be shown and used to explain the available technology for the analysis of bulk and electron transparent specimens.

Single EDS detectors in combination with aberration corrected STEM allow the routine characterization of nm-sized core-shell nanoparticles. Even single light atoms in a carbonatious substrate were identified (R. Stroud et al., M&M 2015).

Multiple detectors and annular detector arrangements ensure large collection angles and minimize shadowing and absorption effects. In STEM a high collection angle enables speed allowing the investigation of beam sensitive samples or 3D analysis. In SEM high topography bulk specimens can be investigated fast and sometimes in a close to natural state, e.g. nano-clay particles, embedded in a porous polymer matrix.

TEM-specimens were investigated in an SEM as well. Different nanoparticle types and their distribution over large areas were statistically evaluated using the T-SEM approach (D-V. Hodoraba et al., IOP Conf. Ser. MSE, EMAS 2015, in press).