MI 2: Analytical Electron Microscopy: SEM and TEM-based Material Analysis
Dienstag, 8. März 2016, 11:15–13:15, H5
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11:15 |
MI 2.1 |
Hauptvortrag:
Nanocharacterisation of the structural and luminescence properties of materials in the scanning electron microscope — •Carol Trager-Cowan, G. Naresh-Kumar, N. Allehiani, S. Kraeusel, B. Hourahine, S. Vespucci, D. Thomson, E. Pascal, R. Johnston, M. Morrison, A. Alasmari, J. Bruckbauer, G. Kusch, P. R. Edwards, R. W. Martin, A. P. Day, A. Winkelmann, A. Vilalta-Clemente, A. J. Wilkinson, P. J. Parbrook, D. Maneuski, V. O’Shea, and K. P. Mingard
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12:00 |
MI 2.2 |
Hauptvortrag:
Highly spatially resolved cathodoluminescence of III-Nitride based nanostructures directly performed in a Scanning Transmission Electron Microscope at liquid He temperatures — •Juergen Christen, Gordon Schmidt, Frank Bertram, Marcus Mueller, and Peter Veit
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12:45 |
MI 2.3 |
Quantifying the magnetism of individual nanomagnets: EMCD on FePt nanoparticles — •Sebastian Schneider, Darius Pohl, Stefan Löffler, Deepa Kasinathan, Jan Rusz, Peter Schattschneider, Schultz Ludwig, and Bernd Rellinghaus
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13:00 |
MI 2.4 |
Ein Experimenteller Standpunkt zur Informationstiefe von EBSD — •Wolfgang Wisniewski
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