Regensburg 2016 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
MI: Fachverband Mikrosonden
MI 3: X-ray Imaging, Holography, Ptychography and Tomography
MI 3.2: Vortrag
Mittwoch, 9. März 2016, 10:45–11:00, H5
Scanning X-Ray Microscopy of Superconductor/Ferromagnet Bilayers — •Claudia Stahl1, Stephen Ruoß1, Markus Weigand1, Patrick Zahn1,2, Jonas Bayer1,2, Gisela Schütz1, and Joachim Albrecht2 — 1Max Planck Institute for Intelligent Systems, Heisenbergstr. 3, 70569 Stuttgart, Germany — 2Research Institute for Innovative Surfaces, FINO, Aalen University, Beethovenstr. 1, 73430 Aalen, Germany
The magnetic flux distribution arising from a high-Tc superconductor is detected and visualized with high spatial resolution using scanning x-ray microscopy (SXM). Therefore, we introduce a sensor layer, namely, an amorphous, soft-magnetic CoFeB cover layer [1]. The magnetic stray fields of the supercurrents lead to a local reorientation of the magnetic moments in the ferromagnet, which is visualized using the large x-ray magnetic circular dichroism (XMCD) effect of the Co and Fe L3-edge.
We show that the XMCD contrast in the sensor layer corresponds to the in-plane magnetic flux distribution of the superconductor [2] and can hence be used to image magnetic structures in superconductors with high spatial resolution [3,4]. Using the total electron yield (TEY) mode the surface structure and the magnetic domains can be imaged simultaneously and can be correlated.
The measurements are carried out at our scanning x-ray microscope MAXYMUS at Bessy II, Berlin with the new low temperature setup.
[1] C. Stahl et al., EPL 106, 27002 (2014). [2] C. Stahl et al., PRB 90, 104515 (2014). [3] S. Ruoß et al., APL 106, 022601 (2015). [4] C. Stahl et al., Journ. of Appl. Phy. 117, 17D109 (2015).