Regensburg 2016 – wissenschaftliches Programm

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MI: Fachverband Mikrosonden

MI 3: X-ray Imaging, Holography, Ptychography and Tomography

MI 3.4: Vortrag

Mittwoch, 9. März 2016, 11:15–11:30, H5

Multi plane probe retrieval in X-ray nearfield imaging — •Johannes Hagemann and Tim Salditt — Institut für Röntgenphysik, GAU Göttingen, Deutschland

The probe, i.e. the impinging X-ray beam on the sample, is the main actor in X-ray imaging experiments when it comes to image quality. We characterized the probe of the GINIX-Setup at P10(DESY) using a multiple detection plane scheme. With that we can determine beam parameters as for example the size of the focus. We could also directly study the influence of different slit settings on the focus. We can compare the results with another approach called longitudinal nearfield ptychography.