MI 3: X-ray Imaging, Holography, Ptychography and Tomography
Mittwoch, 9. März 2016, 10:00–12:30, H5
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10:00 |
MI 3.1 |
Hauptvortrag:
Laboratory-based X-ray microscopy - Technique and applications — •Ehrenfried Zschech, Jürgen Gluch, Sven Niese, Kristina Kutukova, and Qiong Li
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10:45 |
MI 3.2 |
Scanning X-Ray Microscopy of Superconductor/Ferromagnet Bilayers — •Claudia Stahl, Stephen Ruoß, Markus Weigand, Patrick Zahn, Jonas Bayer, Gisela Schütz, and Joachim Albrecht
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11:00 |
MI 3.3 |
Efficiency simulation and measurements for MZP hard X-ray nanofocusing and imaging — •Jakob Soltau, Christian Eberl, Tim Salditt, Hans-Ulrich Krebs, and Markus Osterhoff
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11:15 |
MI 3.4 |
Multi plane probe retrieval in X-ray nearfield imaging — •Johannes Hagemann and Tim Salditt
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11:30 |
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Coffee break (15 min)
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11:45 |
MI 3.5 |
Holography-guided ptychography with soft X-rays — •Piet Hessing, Bastian Pfau, Erik Guehrs, Michael Schneider, Laura Shemilt, Jan Geilhufe, and Stefan Eisebitt
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12:00 |
MI 3.6 |
Polarization contrast of nanoscale waveguides studied by coherent diffractive imaging with high-harmonic source — •Sergey Zayko, Murat Sivis, Sascha Schäfer, and Claus Ropers
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12:15 |
MI 3.7 |
Phase-Contrast Tomography with Anisotropic X-Ray Sources — •Malte Vassholz and Tim Salditt
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