Regensburg 2016 – scientific programme
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MI: Fachverband Mikrosonden
MI 4: Helium and Neon Ion Microscopy for the Analysis and Structuring on the Nanoscale
MI 4.3: Talk
Wednesday, March 9, 2016, 15:30–15:45, H5
Writing nanoscale magnets with neon using a gas field ion source microscope — •Gregor Hlawacek1, Anna Semisalova1, Falk Röder2, Sebastian Wintz1, René Hübner1, Lothar Bischoff1, Hannes Lichte2, Kay Potzger1, Jürgen Lindner1, Jürgen Fassbender1, and Rantej Bali1 — 1Ion Beam Physics and Materials Research, Helmholz—Zentrum Dresden – Rossendorf, Bautzner Landstr. 400, 01328 Dresden, Germany — 2Triebenberg Labor, Institut für Strukturphysik, Technische Universität Dresden, 01062 Dresden, Germany
Gas field ion source (GFIS) based microscopy—historically called Helium Ion Microscopy (HIM)—provides the unique ability to structure material on the nano-scale using an ion beam with a diameter of less than 5 Å. Usually high fluences of the relatively light noble gases are needed to change the shape, or induce property changes in the target structure. Here, we present a method that allows to create arbitrary shaped magnets in a Fe60Al40 alloy using fluences of only a few neon ions per square nanometer. Using neon chemical disorder can be introduced into the paramagnetic B2 phase of the alloy. The increase in Fe–Fe nearest neighbors results in a switch to ferromagnetism in the irradiated area. We will discuss the achievable minimal size (<50 nm) and the in–depth thickness of the magnets (15 nm–60 nm). X-rays, TEM and MFM have been used for characterization.
[1] G. Hlawacek et al., J. Vac. Sci. Technol. B, 32(2):020801, 2014. [2] F. Röder et al., Sci. Rep., 5:16786, 2015. [3] R. Bali et al. Nano Lett., 14(2):435, 2014.