Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
MI: Fachverband Mikrosonden
MI 5: Scanning Probe Microscopy
Mittwoch, 9. März 2016, 16:00–16:45, H5
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16:00 | MI 5.1 | Contrast of nonlinear response in atomic force microscopy — •Daniel Forchheimer, Robert Forchheimer, and David Haviland |
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16:15 | MI 5.2 | Liquid helium free scanning probe microscope working at below 10 K — •Byoung Choi |
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16:30 | MI 5.3 | Fast-scanning and quantitative-imaging atomic force microscopy (AFM) combined with advanced optical techniques — •Elmar Hartmann, Dimitar R. Stamov, and Torsten Jähnke |