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18:00 |
MI 7.1 |
Micro-XRF studies on the colour brilliance in ancient wool carpets — •Andreas Späth, Markus Meyer, Camelia Borca, Karl Meßlinger, Manfred Bieber, and Rainer H. Fink
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18:00 |
MI 7.2 |
The estimation of thickness and composition of thin films using EDX — •Steffen Schulze, Sandra Hahn, Wolfgang Baumann, and Hans-Jörg Hunger
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18:00 |
MI 7.3 |
Generation of electron vortex beams and OAM selection using aberration-corrected probes for local EMCD measurements — Darius Pohl, •Sebastian Schneider, Pascal Gerhards, Jan Rusz, Jakob Spiegelberg, Peter Tiemeijer, and Bernd Rellinghaus
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18:00 |
MI 7.4 |
Nanostructures from electron beam assisted decomposition of gold nitrates — •Daniel Zink, Torsten Henning, and Peter J. Klar
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18:00 |
MI 7.5 |
First results of ptychographic imaging at MAXYMUS X-ray microscope — •Iuliia Bykova, Markus Weigand, Michael Bechtel, Joachim Gräfe, Eberhard Goering, and Gisela Schütz
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18:00 |
MI 7.6 |
Ultra-narrow germanium-slits for laboratory and synchrotron x-ray applications — •F. Döring, S. Hoffmann, M. Kanbach, and Tim Salditt
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18:00 |
MI 7.7 |
Acto-myosin in cardiac muscle cells by scanning x-ray nano-diffraction — •Jan-David Nicolas, Marten Bernhard, and Tim Salditt
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18:00 |
MI 7.8 |
SIMS based in-situ correlative microscopy: HIM-, TEM- and SPM-SIMS — David Dowsett, Santhana Eswara, •Florian Vollnhals, and Tom Wirtz
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18:00 |
MI 7.9 |
Stress Analysis in Semiconductor Devices by Kelvin Probe Force Microscopy — •Evgeniya Sheremet, Florian Fuchs, Soumya D. Paul, Sven Haas, Dietmar Vogel, Raul D. Rodriguez, Andreas Zienert, Jörg Schuster, Danny Reuter, Thomas Geßner, Dietrich R.T. Zahn, and Michael Hietschold
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18:00 |
MI 7.10 |
Characterization of a UHV evaporator for the coating of W-tips for room-temperature SP-STM — •Kai Besocke, Hendrik Bettermann, and Mathias Getzlaff
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