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Tue, 09:30–11:00 |
H5 |
MI 1: Electron Probe Microanalysis |
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Tue, 11:15–13:15 |
H5 |
MI 2: Analytical Electron Microscopy: SEM and TEM-based Material Analysis |
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Wed, 10:00–12:30 |
H5 |
MI 3: X-ray Imaging, Holography, Ptychography and Tomography |
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Wed, 15:00–15:45 |
H5 |
MI 4: Helium and Neon Ion Microscopy for the Analysis and Structuring on the Nanoscale |
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Wed, 16:00–16:45 |
H5 |
MI 5: Scanning Probe Microscopy |
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Wed, 17:00–17:30 |
H5 |
MI 6: Special Talk: Solid State Characterisation with Positrons |
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Wed, 18:00–20:00 |
Poster E |
MI 7: Poster: Microanalysis and Microscopy |
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Thu, 15:40–17:00 |
H26 |
MI 8: Crystallography in Materials Science (KR, DF, MI) |
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