Regensburg 2016 – wissenschaftliches Programm
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MM: Fachverband Metall- und Materialphysik
MM 17: Topical session: In-situ Microscopy with Electrons, X-Rays and Scanning Probes in Materials Science I
MM 17.2: Vortrag
Dienstag, 8. März 2016, 10:45–11:15, H38
Controlled scanning probe manipulation and lithography: What can be learned about mesoscale friction and abrasive wear? — •Enrico Gnecco1,2, Patricia Pedraz2, and Reinhold Wannemacher2 — 1Otto Schott Institute of Materials Research, Friedrich Schiller University Jena, Germany — 2IMDEA Nanociencia, Madrid, Spain
Atomic force microscopy is an invaluable technique to investigate friction mechanisms on the nano- and mesoscale. We will first focus on nanomanipulation experiments and discuss how the trajectories of nanoparticles on solid substrates are related to the scan path followed by the AFM probe and the friction between particles and substrate. Irregularly shaped Sb islands and wavy glass surfaces are chosen as examples. The discussion will be extended to the formation of wear patterns on compliant surfaces also in relation to the AFM scan path. Solvent enriched polymers at room temperature are an optimum benchmark for this kind of experiments. In this case the dependence of wear patterns on the normal force and scanning velocity is easily explained by an extension of the well-established Prandtl-Tomlinson model for atomic-scale friction. In particular we observe a phase transition between wearless sliding and rippling of the substrate surface, which is reminescent of the stick-slip/continuous sliding transition on the atomic scale. The wearless regime can also be entered by mechanical excitation of the contact resonance during the sliding.