Regensburg 2016 – wissenschaftliches Programm

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MM: Fachverband Metall- und Materialphysik

MM 17: Topical session: In-situ Microscopy with Electrons, X-Rays and Scanning Probes in Materials Science I

MM 17.3: Vortrag

Dienstag, 8. März 2016, 11:15–11:30, H38

Exploring the friction between atomic layers with in situ SEM mechanical testing — •Peter Schweizer, Florian Niekiel, and Erdmann Spiecker — Center for Nanoanalysis and Electron Microscopy (CENEM), University of Erlangen-Nuremberg, Cauerstr. 6, 91058, Erlangen, Germany

With the advent of nano-electromechanical systems, the understanding of atomic-scale friction becomes very important, since the life-time and functionality of such systems is often limited by the effects of friction and wear. Interfaces made of flat atomic layers can in certain conditions show the effect of ultra-low friction, also referred to by the term of ”superlubricity”, which might alleviate the tribological problems that NEMS face today. However there are still a lot of open questions regarding friction on the atomic scale, especially the evolution of the microstructure in an interface during sliding.

In this work we present an approach to quantitatively measure the friction forces between atomic layers, using vanadium diselenide (VSe₂) as a model system. Following a preparation routine with the focused ion beam area dependent friction forces are measured in situ in the scanning electron microscope with the help of a micro-manipulator and a spring table. The microstructure of the interface is analyzed after sliding using transmission electron microscopy. Different crystallographic orientations of the tribological interface are compared and links to the microstructure are drawn.