MM 52: Topical session: In-situ Microscopy with Electrons, X-Rays and Scanning Probes in Materials Science VI - Structural transitions
Donnerstag, 10. März 2016, 11:45–13:15, H38
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11:45 |
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15 min. coffee break
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12:00 |
MM 52.1 |
Grain growth of nc-Pd during heating using ACOM-STEM — •KK Neelisetty, A Kobler, VSK Chakravadhanula, T Scherer, H Hahn, and C Kübel
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12:15 |
MM 52.2 |
Solid-state Dewetting of Metallic Thin Films Studied by Complementary in situ Transmission Electron Microscopy Techniques — •Florian Niekiel, Simon M. Kraschewski, Peter Schweizer, Benjamin Butz, and Erdmann Spiecker
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12:30 |
MM 52.3 |
Suppression of phase transformations in Nb-H thin films — •Vladimir Burlaka, Stefan Wagner, and Astrid Pundt
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12:45 |
MM 52.4 |
Influence of patterned stress states on hydrogen loading in Vanadium thin films studied by electrochemical hydrogenography — •Anshu Tyagi, Florian Döring, Hans-Ulrich Krebs, and Astrid Pundt
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13:00 |
MM 52.5 |
Transmission electron microscopy image and energy-dispersive X-ray map simulations of Ga-covered Pb nanoparticles embedded in an Al matrix. — •Martin Peterlechner and Gerhard Wilde
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