Regensburg 2016 – wissenschaftliches Programm

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MM: Fachverband Metall- und Materialphysik

MM 52: Topical session: In-situ Microscopy with Electrons, X-Rays and Scanning Probes in Materials Science VI - Structural transitions

MM 52.2: Vortrag

Donnerstag, 10. März 2016, 12:15–12:30, H38

Solid-state Dewetting of Metallic Thin Films Studied by Complementary in situ Transmission Electron Microscopy Techniques — •Florian Niekiel, Simon M. Kraschewski, Peter Schweizer, Benjamin Butz, and Erdmann Spiecker — Institute of Micro- and Nanostructure Research & Center for Nanoanalysis and Electron Microscopy (CENEM), Universität Erlangen-Nürnberg, Erlangen, Germany

The transition of a thin film into an energetically favorable set of particles at temperatures below the melting temperature of the bulk material is denominated as solid-state dewetting. This phenomenon is on the one hand an undesirable degradation and failure mechanism in thin film applications. On the other hand it can deliberately be exploited to generate nanoparticle arrays with controlled shape, ordering and composition.

In this work we use complementary in situ transmission electron microscopy (TEM) techniques with a chip-based heating system to study the underlying physics during solid-state dewetting. The techniques employed range from electron diffraction over scanning transmission electron microscopy (STEM) to high-resolution TEM. The combination of statistical information with microscopical information down to the atomic scale provides insights into the kinetics, texture evolution and mechanisms involved.