Regensburg 2016 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
O: Fachverband Oberflächenphysik
O 42: Plasmonics and Nanooptics III: Infrared Microscopy
O 42.5: Vortrag
Dienstag, 8. März 2016, 15:00–15:15, H4
Characterization of Thin Organic Layers using Synchrotron-based nano-FTIR Spectroscopy with adapted Storage Ring Optics — •Peter Hermann1, Arne Hoehl1, Bernd Kästner1, C. Magnus Johnson2, Piotr Patoka3, Georg Ulrich3, Jörg Feikes4, Markus Ries4, Tobias Götsch4, Burkhard Beckhoff1, Eckart Rühl3, and Gerhard Ulm1 — 1Physikalisch-Technische Bundesanstalt (PTB), 10587 Berlin, Germany — 2School of Chemical Science and Engineering, KTH, SE-100 44 Stockholm, Sweden — 3Physikalische und Theoretische Chemie, Institut für Chemie und Biochemie, Freie Universität Berlin, 14195 Berlin, Germany — 4Helmholtz-Zentrum Berlin (HZB), 12489 Berlin, Germany
Near-field techniques such as infrared scanning near-field optical microscopy (SNOM) and nano-FTIR spectroscopy enable imaging and spectroscopic characterization of samples at the nanoscale. However, the spectroscopic characterization of thin organic films and monolayers requires additionally highly stable radiation sources with a broad emission spectrum in the mid-IR range, e.g. thermal and synchrotron based sources. In order to exploit the full potential of this approach, we report on the adaption of storage ring optics at the Metrology Light Source (MLS). This results in a significantly reduced size of the electron bunches. In combination with appropriate spectral filters the sensitivity of synchrotron-based near-field spectroscopy can be increased even further, thus enabling also the spectroscopic characterization of organic samples. This is demonstrated by performing nano-FTIR spectroscopy and nano-imaging on biological model systems.