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14:00 |
O 42.1 |
Determination of local variations in charge carrier concentrations of doped nanowires using infrared near-field microscopy — •Lena Jung, Robert Ukropec, Fabian Haas, Hilde Hardtdegen, Thomas Schäpers, and Thomas Taubner
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14:15 |
O 42.2 |
Experimental investigation of the depth-dependent near-field coupling in subsurface s-SNOM imaging. — •Mike Prämassing, Martin Lewin, and Thomas Taubner
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14:30 |
O 42.3 |
Amplitude-modulated scattering cross-section in near-field infrared microscopy (s-SNIM) — •Frederik Kuschewski, S.C. Kehr, N. Awari, B. Green, S. Kovalev, M. Gensch, and L.M. Eng
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14:45 |
O 42.4 |
Exploring local-scale phase transitions by low-temperature scattering scanning near-field optical microscopy — •Jonathan Döring, Susanne C. Kehr, and Lukas M. Eng
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15:00 |
O 42.5 |
Characterization of Thin Organic Layers using Synchrotron-based nano-FTIR Spectroscopy with adapted Storage Ring Optics — •Peter Hermann, Arne Hoehl, Bernd Kästner, C. Magnus Johnson, Piotr Patoka, Georg Ulrich, Jörg Feikes, Markus Ries, Tobias Götsch, Burkhard Beckhoff, Eckart Rühl, and Gerhard Ulm
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15:15 |
O 42.6 |
Surface-enhanced infrared chemical imaging — •Frank Neubrech, Lucca Kühner, Mario Hentschel, Ute Zschieschang, Hagen Klauk, and Harald Giessen
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15:30 |
O 42.7 |
Terahertz spectroscopy of individual donors in silicon by low temperature s-SNOM — •Denny Lang, Stephan Winnerl, Harald Schneider, Juerong Li, Steve Clowes, Ben Murdin, Jonathan Döring, Susanne C. Kehr, Lukas M. Eng, and Manfred Helm
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15:45 |
O 42.8 |
Terahertz responses of a metal with sub-nm gap — •tae yun kim, sang jun park, dai-sik kim, and cheol-hwan park
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