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18:15 |
O 44.1 |
Effect of electron-density inhomogeneities on the electronic band structure of single-layer graphene — •Trevor Clarke, Peter Kot, Jon Parnell, Sina Habibian, Klaus Kern, and Christian R. Ast
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18:15 |
O 44.2 |
Robust ballistic transport phenomena in epitaxial graphene nanoribbons — •Johannes Aprojanz, Jens Baringhaus, Maren Wehr, Felix Klösel, and Christoph Tegenkamp
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18:15 |
O 44.3 |
A bottom-up approach to synthesize graphene nanoribbons on Ru(0001) by chemical vapor deposition — •Ann-Kathrin Henss and Joost Wintterlin
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18:15 |
O 44.4 |
Twisted graphene layers on metals investigated by scanning tunneling microscopy — •Sabina Simon, Philipp Leicht, Julia Tesch, Luca Gragnaniello, and Mikhail Fonin
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18:15 |
O 44.5 |
Graphene formation on Ag(001) by liquid precursor deposition — •Jens Uwe Neurohr, Samuel Grandthyll, Karin Jacobs, and Frank Müller
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18:15 |
O 44.6 |
Lifting Graphene from Substrates by Scanning Tunneling Microscopy — •Anne Holtsch, Anne Holtsch, Wolf-Rüdiger Hannes, and Uwe Hartmann
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18:15 |
O 44.7 |
Flipping ripples of freestanding graphene membranes using Scanning Tunneling Microscopy — •Bernd Uder, Wolf-Rüdiger Hannes, and Uwe Hartmann
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18:15 |
O 44.8 |
Local transport measurements in Graphene on SiO2 using Kelvin Probe Force Microscopy — Philip Willke, Christian Möhle, •Anna Sinterhauf, Thomas Kotzott, Hak Ki Yu, Alec Wodtke, and Martin Wenderoth
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18:15 |
O 44.9 |
Epitaxial graphene via flash annealing of SiC studied by VT-STM — •Ismail Baltaci, Malte Schulte, Eugenia Wodopian, Harry Ritter, and Carsten Westphal
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18:15 |
O 44.10 |
STM characterization of epitaxial graphene produced by confinement controlled sublimation of SiC — Hermann Kromer, Cornelis Hilscher, Richard Hönig, Christoph Keutner, Carsten Westphal, and •Ismail Baltaci
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18:15 |
O 44.11 |
Graphene growth on SiC(1120) — •Stefanie Rumbke, Florian Speck, and Thomas Seyller
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18:15 |
O 44.12 |
High quality graphene on boron nitride prepared by polymer free dry transfer and contacting techniques for combined STM and electrical transport measurements — •Tjorven Johnsen, Daniel Montag, Felix Jekat, Martin Grob, Nils Freitag, Peter Nemes-Incze, and Markus Morgenstern
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