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O: Fachverband Oberflächenphysik

O 45: Graphene: Adsorption, Intercalation and Doping

O 45.11: Poster

Dienstag, 8. März 2016, 18:15–20:30, Poster E

Higher Order Corrected Spectroscopy at the Carbon K Edge — •Christine Jansing¹, Hans-Christoph Mertins¹, Andreas Gaupp^1,2, Andrey Sokolov², Markus Gilbert¹, Andreas Schümmer¹, Hud Wahab³, Heiko Timmers³, and Suk-Ho Choi⁴ — ¹Münster University of Applied Sciences, Stegerwaldstr. 39, D-48565 Steinfurt — ²HZB, Albert Einstein Str. 15, D-12489 Berlin — ³University of New South Wales, Canberra, ACT 2600, Australia — ⁴Kyung Hee University, Yongin 446-701, Korea

We present the experimental determination of disturbing higher order synchrotron radiation across the carbon K edge at a soft x-ray beamline and a procedure to correct spectra of carbonaceous materials like highly oriented pyrolytic graphite (HOPG) or graphene. Measurements in the soft x-ray regime suffer from an enormous loss of photon flux at the C K edge, caused by carbon contamination of the beamlines optical elements. The unavoidable contaminations result from residual organic molecules in the beamline getting cracked by synchrotron radiation and absorbed as adventious carbon on mirrors. In particular first order radiation is absorbed so that incident light has large contributions from higher order wavelengths. We determined the amount of higher order light of up to 60% in the π*-resonance of carbon exploiting a second monochromator and alternatively using a simple filter. We show that both methods reveal a reliable set of data to correct on higher order distortion of our experimental reflection and absorption spectra. This correction procedure can be applied to any carbonaceous material's spectra.