Regensburg 2016 – scientific programme
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O: Fachverband Oberflächenphysik
O 56: Nanostructures: Dots, Particles and Clusters
O 56.3: Talk
Wednesday, March 9, 2016, 11:00–11:15, H4
Mass selected copper clusters on thin oxide films investigated with STM — •Dominik Wolter1, Raphael Floegel1, Matthias Bohlen1,2, Christoph Schröder1, Conrad Becker3, and Heinz Hövel1 — 1Fakultät Physik / DELTA, Technische Universität Dortmund, 44221 Dortmund, Germany — 2Now at: Physikalisches Institut, Universität Freiburg, 79104 Freiburg, Germany — 3Aix-Marseille Université, CNRS, CINaM UMR 7325, 13288 Marseille, France
Oxide layers are commonly used for industrial purposes (e.g. microelectronics) but also a topic of current research. It was shown previously, that an Al2O3 film on a clean Ni3Al(111) surface can provide a template for palladium cluster array growth [1]. The quality of the oxidized surface was investigated with Low-Energy Electron Diffraction and Scanning Tunneling Microscopy. These oxide films are suitable for the deposition and investigation of mass selected clusters, because the layers are thick enough to minimize cluster-surface interaction but simultaneously thin enough to keep characterization with STM feasible. We evaluate the apparent height of deposited copper clusters as well as the next-neighbor distances in order to investigate their arrangement on the oxidized surface. Furthermore the mobility of the clusters is analyzed by incremental heating procedures. The next-neighbor distances can then be compared to Monte Carlo simulation data for various lattices to check whether the clusters attach to the template structure given by the oxide film or not. [1] S. Degen, C. Becker and K. Wandelt, Faraday Discuss., 125, 343-356 (2004).