Regensburg 2016 – scientific programme
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O: Fachverband Oberflächenphysik
O 71: Scanning Probe Techniques and New Experimental Methods
O 71.12: Poster
Wednesday, March 9, 2016, 18:15–20:30, Poster A
Following ultra thin film growth by in-situ High Energy X-ray Diffraction — •Florian Bertram, Olof Gutowski, and Uta Ruett — DESY Photon Science, Notkestrasse 85, 22607 Hamburg, Germany
High energy x-ray diffraction (≈ 80 keV) is a versatile tool to record diffraction patterns from surfaces, interfaces, and ultra-thin films at remarkable high speed compared to conventional diffraction measurements (≈ 15 keV). Due to the high photon energy diffraction angles become smaller, which results in a much flatter Ewald’s sphere in a given q-range. Therefore, crystal truncation rods (CTR’s) can be recorded in grazing incident geometry by a simple rotation of a few degree with a 2D detector at a fixed position.
We demonstrate how this method can be used to record real time diffraction data during MBE growth of ultra-thin films. Here, the growth of magnetite (Fe3O4) on MgO(001) was studied. We could follow the evolution of the CTR’s during growth with a time-resolution of 5 sec.