Regensburg 2016 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 71: Scanning Probe Techniques and New Experimental Methods

O 71.7: Poster

Mittwoch, 9. März 2016, 18:15–20:30, Poster A

AFM for TERS: Development of probe heads for Tip-Enhanced-Raman-Spectroscopy — •Jalmar Tschakert¹, Thomas Göddenhenrich¹, André Schirmeisen¹, Marcel Weinhold², Thomas Sander², and Peter J. Klar² — ¹Institut für Angewandte Physik, Justus-Liebig-Universtiät Gießen — ²I. Physikalisches Institut, Justus-Liebig-Universität Gießen

Tip-Enhanced-Raman-Spectroscopy (TERS) has become a powerful tool in material science to combine topographic and chemical imaging. Our experimental TERS setup is based on an inverted optical microscope with an x,y scan stage for scanning transparent samples. Two different type of AFM heads are developed: one with a cantilever and a fiber-optical interferometer and the other based on a quartz-tuning-fork. Both designs are compact and give a good long time thermal and mechanical stability without the need of an additional damping mechanism. Contact and non-contact measurements are controlled via GXSM software with a Soft-dB-Mk3-DSP board leading to a flexible scan control with different AFM probes as well as the option to add own user specific tasks.