Regensburg 2016 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 84: Scanning Probe Techniques: Method Developments
O 84.3: Vortrag
Donnerstag, 10. März 2016, 15:45–16:00, S054
Effect of amplitude on bimodal frequency modulation atomic force microscopy with small amplitudes in ambient conditions — •Dominik Kirpal1, Hiroaki Ooe2, Daniel Wastl1, Alfred J. Weymouth1, Toyoko Arai2, and Franz J. Giessibl1 — 1Department of Physics, University of Regensburg, Regensburg, Germany — 2Natural Science and Technology, Kanazawa University, Kanazawa, Japan
Bimodal atomic force microscopy (AFM) is usually performed with the first flexural mode excited at a large amplitude to maintain a stable oscillation, and the second mode excited at a small amplitude to be sensitive to short-range interactions. A stiff cantilever, such as the one provided by a qPlus sensor, can be used to perform bimodal AFM with small amplitudes in both flexural modes. We calculated the piezoelectric sensitivity of the qPlus sensor in the second flexural mode and imaged KBr(100) in ambient conditions to determine the ideal amplitudes for atomic resolution with bimodal AFM. The highest signal-to-noise ratio is achieved if the total vertical displacement of the tip in each cycle is less than the thickness of a single hydration layer.