Regensburg 2016 – scientific programme
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O: Fachverband Oberflächenphysik
O 84: Scanning Probe Techniques: Method Developments
O 84.4: Talk
Thursday, March 10, 2016, 16:00–16:15, S054
Force reconstruction with multifrequency kernel spectroscopy — •Daniel Platz1,2, Daniel Forchheimer2,3, Erik A. Tholen3, John E. Sader4, and David B. Haviland2 — 1Max Planck Institute for the Physics of Complex Systems, Nöthnitzer Straße 38, D-01187 Dresden, Germany — 2KTH Royal Institute of Technology, Albanova University Center, SE-114 19 Stockholm, Sweden — 3Intermodulation Products AB, Landa Landavägen 4193, SE-823 93 Segersta, Sweden — 4The University of Melbourne, Victoria 3010, Australia
The object of interest in dynamic atomic force microscopy (AFM) is the interaction force between a sample surface and the tip of an oscillating cantilever. However, the measured data in AFM do not describe this interaction force directly but rather describe properties of the cantilever motion like amplitudes, phase or frequency shifts. Each AFM mode requires extensive modeling to link the measured data and physical properties of the interaction force. Here, we present a general method, called multifrequency kernel spectroscopy (MKS), for interpreting measured AFM data. The method allows for a clear measurement of the "amount of information" in AFM data and a quantitative reconstruction of the interaction force for any AFM mode. To demonstrate the capabilities of MKS we use it to unambiguously separate long and short range forces in multifrequency magnetic force microscopy and reconstruct the tip-sample interaction force from amplitude-modulated AFM measurements.