Regensburg 2016 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 84: Scanning Probe Techniques: Method Developments
O 84.9: Vortrag
Donnerstag, 10. März 2016, 17:15–17:30, S054
Quantitative mapping of magnetic stray fields by dynamic mode magnetic force microscopy — Christopher F. Reiche1, •Clemens Gütter1, Silvia Vock1, Volker Neu1, Bernd Büchner1,2, and Thomas Mühl1 — 1Leibniz-Institut für Festkörper- und Werkstoffforschung IFW Dresden — 2Institut für Festkörperphysik, Technische Universität Dresden
Dynamic mode magnetic force microscopy (MFM) is a successful method to study magnetic stray fields of samples with high spatial resolution. Quantitative approaches based on frequency modulation measurements and a point probe approximation for the magnetic tip can supply information about the first or the second order spatial derivative of the magnetic stray field of a sample. However, often it would be favorable to know the more fundamental stray field itself.
Here, we demonstrate a technique that enables the measurement of one component of the magnetic stray field of a sample in real space. This technique is based on the integration of frequency shift signal maps gathered at different measurement heights. It employs calibrated iron filled carbon nanotube magnetic tips with monopole-like characteristic [1]. While this technique has some requirements on the sample it does not need any special kind of MFM equipment.
The viability of this approach was validated by measurements on a well-characterized Pt/Co magnetic multilayer sample. For such a sample it is possible to calculate its magnetic stray field based on an effective magnetic surface charge pattern approach and compare it to the measured results.
F. Wolny et al., Nanotechnology 21 (2010) 435501