Regensburg 2016 – scientific programme

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PV: Plenarvorträge

PV II

PV II: Prize Talk

Monday, March 7, 2016, 13:15–13:45, H15

Diffractive imaging from multiple near-field diffraction intensities — •Lars Lötgering — Institute for X-Optics, RheinAhrCampus Remagen - Joseph-Rovan-Allee 2, 53424 Remagen, Germany — Laureate of the Georg-Simon-Ohm-Prize

Throughout the past decade the optics community witnessed the development of various diffractive imaging modalities that recover microscopic information from diffraction data without the use of focusing refractive or diffractive lenses. Here we present a diffractive imaging method that utilizes correlation in near-field diffraction patterns to provide data redundancy from which object information is extracted. An increase in resolution is achieved by means of a cross-correlation based image registration procedure which enlarges the effective numerical aperture of the experimental setup. No a priori knowledge or scanning of the object is necessary as opposed to coherent diffractive imaging or ptychography.