Regensburg 2016 – scientific program
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Note: Program updates are published on the Notice-Board and in the individual program. This static PDF version of Jan 22nd 2016 contains the same data like the printed version.
Full program
mi.pdf (414.3 KB)
Program overview
misummary.pdf (120.8 KB)
Program of the individual sessions
| MI 1 | Tue, 09:30 - 11:00 | H5 | Electron Probe Microanalysis | mi1.pdf (206.2 KB) |
| MI 2 | Tue, 11:15 - 13:15 | H5 | Analytical Electron Microscopy: SEM and TEM-based Material Analysis | mi2.pdf (246.5 KB) |
| MI 3 | Wed, 10:00 - 12:30 | H5 | X-ray Imaging, Holography, Ptychography and Tomography | mi3.pdf (236.0 KB) |
| MI 4 | Wed, 15:00 - 15:45 | H5 | Helium and Neon Ion Microscopy for the Analysis and Structuring on the Nanoscale | mi4.pdf (202.9 KB) |
| MI 5 | Wed, 16:00 - 16:45 | H5 | Scanning Probe Microscopy | mi5.pdf (198.9 KB) |
| MI 6 | Wed, 17:00 - 17:30 | H5 | Special Talk: Solid State Characterisation with Positrons | mi6.pdf (181.2 KB) |
| MI 7 | Wed, 18:00 - 20:00 | Poster E | Poster: Microanalysis and Microscopy | mi7.pdf (255.3 KB) |
| MI 8 | Thu, 15:40 - 17:00 | H26 | Crystallography in Materials Science (KR, DF, MI) | mi8.pdf (225.9 KB) |