Dresden 2017 – wissenschaftliches Programm

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DF: Fachverband Dielektrische Festkörper

DF 9: Poster Session

DF 9.24: Poster

Dienstag, 21. März 2017, 14:00–16:00, P1C

Frequency analysis in scanning probe microscopy — •Sarmed Hussain and Elisabeth Soergel — Physics Institute of Bonn University, Bonn, Germany

Piezoresponse force microscopy (PFM) has emerged as a key-method for mapping domain patterns in ferroelectric materials with high lateral resolution an impressive sensitivity. For recording quantitatively reliable data (in terms of the magnitude of the piezomechanical response), however, a method for calibration is still missing. Besides the need for a calibration standard, there is in addition the difficulty of the frequency dependence of the data recorded, most prominent when investigating samples with small piezoelectric coefficients. Although it might eventually not be possible to get rid of this frequency dependence, its origin is of interest for a better evaluation of the, presumably quantitative PFM-data obtained.