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DS: Fachverband Dünne Schichten

DS 31: 2D Materials Beyond Graphene III (jointly with O)

DS 31.5: Vortrag

Mittwoch, 22. März 2017, 11:30–11:45, WIL A317

Time-of-Flight Secondary Ion and Neutral Mass spectrometry of particles ejected from 3D and 2D materials during irradiation with highly charged and swift heavy ions — •Philipp Ernst¹, Florian Meinerzhagen¹, Matthias Herder², Stephan Sleziona¹, Andreas Wucher², and Marika Schleberger¹ — ¹University Duisburg-Essen, AG Schleberger, Germany — ²University Duisburg-Essen, AG Wucher, Germany

We have studied the ionization probability for strontium titanate bombarded by energetic ions, i.e. swift heavy ions (SHI) and highly charged ions (HCI). Strontium titanate is a dielectric and as such is known to be very sensitive to both, SHI and HCI irradiation, which result in characteristic surface modifications [1,2]. Therefore, it has been postulated that both projectile types trigger similar mechanisms leading to these modifications. To test this hypothesis, we compare time-of-flight mass spectra taken during irradiation with SHI at different electronic stopping powers (dE/dx) and with HCI with varying potential energy (¹²⁹Xe ions with a potential energy from E_pot 4.5 up to 59 keV by constant kinetic energy E_kin), respectively. Both, emitted secondary ions (SIMS) and secondary neutrals (SNMS), were detected in order to determine differences of the ionization probability. To further test if the spatial distribution of the energy deposition (HCI a few nm, SHI up to tens of microns) does play a role, exemplary measurements with a 2D dielectric have been performed.

[1] F. Meinerzhagen, et al. Rev. Sci. Instr, 87 (2016) 013903.

[2] F. Aumayr, et al. J. Phys. Condens. Matter, 23 (39) (2011).