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DS: Fachverband Dünne Schichten

DS 36: Postersession I

DS 36.9: Poster

Mittwoch, 22. März 2017, 17:00–19:00, P2-EG

Spectroscopic Ellipsometry as a Method for Structural Investigation of Spinel Ferrite Thin Films — •Vitaly Zviagin¹, Yogesh Kumar¹, Paula Huth², Israel Lorite¹, Annette Setzer¹, Daniel Spemann³, Karsten Fleischer⁴, Jan Meijer¹, Reinhard Denecke², Pablo Esquinazi¹, Marius Grundmann¹, and Rüdiger Schmidt-Grund¹ — ¹Universtät Leipzig, Institut für Experimentelle Physik II, Linnéstr. 5, Germany — ²Universtät Leipzig, Wilhelm-Ostwald-Institut für Physikalische und Theoretische Chemie, Linnéstr. 2, Germany — ³Leibniz-Institut für Oberflächenmodifizierung e. V., Permoserstr. 15, Germany — ⁴School of Physics, Trinity College Dublin, Dublin 2, Ireland

ZnFe₂O₄ and composite Zn_xFe_3−xO₄ thin films were deposited at different conditions on SrTiO₃ (100) and MgO (100) substrates by pulsed laser deposition. Features in the diagonal elements of the dielectric tensor, obtained by spectroscopic ellipsometry, hint to the presence of Fe²⁺ and Fe³⁺ cations located within the lattice by assignment of electronic transitions. While the increase of Fe²⁺ cation concentration on octahedral lattice sites corresponds to the increase in conductivity, measured by Hall effect, the increase of Fe³⁺ cation concentration on tetrahedral lattice sites corresponds to the increase in ferrimagnetic response of the spinel thin films, measured by SQUID.[1] In agreement with complimentary methods such as XPS and XAS, the presence of the mentioned cations corresponds to disorder and inversion of the lattice structure, also induced by annealing or irradiation with Si ions.
V. Zviagin et al., Appl. Phys. Lett. 108, 13 (2016)